中英文注释及缩写

中英文注释及缩写

X射线光电子能谱:X-ray Photoelectron Spectroscopy(XPS)

化学分析电子能谱:Electron Spectroscopy for Chemical Analysis(ESCA)

俄歇电子能谱仪:Auger Electron Spectroscopy(AES)

X射线诱导俄歇电子能谱/XPS俄歇谱峰:Auger electron in XPS spectra(XAES)

反光电子能谱:Inverse Photoemission Spectroscopy(IPES)

紫外光电子能谱:Ultraviolet Photoelectron Spectroscopy(UPS)

透射电子显微镜:Transm ission Electron Microscope(TEM)

扫描电子显微镜:Scanning Electron Microscope(SEM)

能谱仪:Energy Dispersive Spectrometer(EDS)

电感耦合等离子体质谱仪:Inductively Coupled Plasma Mass Spectrometry(ICP-MS)

X射线荧光光谱仪:X-ray Fluorescence Spectrometer(XRF)

傅里叶变换红外光谱仪:Fourier Transform Infrared Spectroscopy(FTIR)

拉曼光谱:Raman Spectroscopy

飞行时间二次离子质谱:Time of Flight Secondary Ion Mass Spectrometry(TOF-SIMS)

动态二次离子质谱:Dynamic Secondary Ion Mass Spectrometry(D-SIMS)

X射线衍射仪:X-ray Diffraction(XRD)

结合能:Binding Energy(B.E.)

功函数:Work Function

费米能级:Fermi Level

非弹性背底:Inelastic background

非弹性散射平均自由程:Inelastic Mean Free Path(IMFP),λ

电离截面:Ionization cross section,σ

起飞角/起飞角度:Take off angle

半峰宽/半高宽:FullWidth Half Maximum(FWHM)

化学位移:Chemical shift

化学态:Chem ical state

氧化态:Oxidation state

还原态:Reduction state

精细谱/窄扫描:Fine spectrum/Narrow scan

全谱扫描/全谱:Survey spectra scan/Survey spectra

线扫描:Line scan

面分布:Mapping(https://www.daowen.com)

变角分析:Angle Dependent XPS/Angle analysis

线宽:Line width

能量位移:Energy shift

通能:Pass Energy(PE)

半球型能量分析器:Hemispherical energy analyzer

微区成像:Micro Imaging/Micro Mapping

二次电子图像/射线成像:Secondary electronic image/Static X-ray Image(SXI)

(相对)灵敏度因子:Relative Sensitivity Factor(RSF)

修正(相对)灵敏度因子:Corrected Relative Sensitivity Factor(CorrectedRSF)

氩离子枪:Ar Ion Gun

气体团簇离子束:Gas Cluster Ion Beam(GCIB)

谱峰/谱线:Spectrum peak/Spectrum lines

光电子谱峰:Photoelectron lines

轨道自旋分裂峰:Spin-Orbital Splitting(SOS)

震激/震离峰:Shake-up/Shake-off lines

多重分裂峰:Multip let splitting

能量损失峰:Energy loss lines/Plasmon lines

俄歇谱峰:Auger lines

俄歇参数:Auger Parameter

修正俄歇参数:Modified Auger Parameter

价带谱:Valence lines and bands

卫星峰:Satellite lines(Satellite/sat.)

鬼峰:Ghost lines

谱峰标注:Notation

传输函数:Transfer Function(TF)

标准偏差:Standard Deviation(St.Dev.)

原子浓度:Atomic Concentration(AC)

非线性最小二乘拟合:Non-Linear Least-Squares Fit(NLS,NLLSF)

卡方检验:Chi-Squared Test

曲线拟合:Curve Fitting

谱峰面积:Peak Area

原子百分比:Atomic%(AC%)